2007 Proceedings

+ 1A Advances in Parasitic Extraction and Variability Modeling
+ 1B Networks-on-Chip and Latency-Insensitive Systems
+ 1C Power Grid Analysis
+ 1D Synthesis and Verification of Quantum Circuits
+ 2A Connecting Physical Challenges and Design Approaches
+ 2B Analytical Techniques for Physical Optimization
+ 2C Logic Synthesis
+ 2D Memory Optimization and System-Level Timing
+ 3A Resilient and Regular Circuits
+ 3B 3-D Integration Challenges
- 3C Applications of SAT and QBF
3C.1 Scalable Exploration of Functional Dependency by Interpolation and Incremental SAT Solving
3C.2 Incremental Learning Approach and SAT Model for Boolean Matching with Don't Cares
3C.3 A Performance-Driven QBF-based Iterative Logic Array Representation With Applications to Verifi
+ 3D Embedded Tutorial: Physical Synthesis Comes of Age
+ 4A High Quality Testcases for Verification
+ 4B Advances in Embedded Systems
+ 4C Can Nano-Photonic Silicon Circuits Become an Intra-Chip Interconnect Technology
+ 4D Designers' Perspective: Memory Design Challenges in Sub-65-nm Technologies
+ 5A Scaling Formal Verification
+ 5B Advances in Statistical Timing Analysis and Optimization
+ 5C Sequential Synthesis and FPGA Mapping
+ 5D Designers' Perspective: High Speed I/O
+ 6A Advances in Routing and Clock Design
+ 6B Improving Delay Test Generation and Performance Predictors
+ 6C High Level Synthesis
+ 6D Analog Circuit Optimization
+ 7A Global Routing
+ 7B Test Compression and Test Power
+ 7C Gate-level Physical Synthesis
+ 7D Designers' Perspective: Foundry and Circuit Designer Communication
+ 8A Interconnect Modeling and Optimization
+ 8B Embedded Tutorial: Formal verification at Higher Levels of Abstraction
+ 8C Floorplanning
+ 8D System-level Synthesis and Interconnect Design
+ 9A Advances in Model Order Reduction Techniques For Interconnect Analysis
+ 9B Embedded Tutorial: MOSFET Modeling for 45nm & Beyond
+ 9C Voltage Assignment in Floorplanning
+ 9D Variation-Tolerant Circuits
+ 10A Advanced Models for Static Timing Analysis
+ 10B Variation Aware Timing Verification
+ 10C Reliability-Driven Modeling and Analysis for Deep Submicron Technologies
+ 10D Design Automation and Defect Tolerance Techniques for Emerging Technologies
+ 11A Leakage Power Reduction
+ 11B Power Modeling and Optimization
+ 11C Improving Planarity and Patterning
+ 11D Model Order Reduction for Parameterized and Non-Linear Systems