2007 Proceedings

+ 1A Advances in Parasitic Extraction and Variability Modeling
+ 1B Networks-on-Chip and Latency-Insensitive Systems
+ 1C Power Grid Analysis
+ 1D Synthesis and Verification of Quantum Circuits
+ 2A Connecting Physical Challenges and Design Approaches
+ 2B Analytical Techniques for Physical Optimization
+ 2C Logic Synthesis
+ 2D Memory Optimization and System-Level Timing
+ 3A Resilient and Regular Circuits
+ 3B 3-D Integration Challenges
+ 3C Applications of SAT and QBF
+ 3D Embedded Tutorial: Physical Synthesis Comes of Age
+ 4A High Quality Testcases for Verification
+ 4B Advances in Embedded Systems
+ 4C Can Nano-Photonic Silicon Circuits Become an Intra-Chip Interconnect Technology
+ 4D Designers' Perspective: Memory Design Challenges in Sub-65-nm Technologies
+ 5A Scaling Formal Verification
+ 5B Advances in Statistical Timing Analysis and Optimization
- 5C Sequential Synthesis and FPGA Mapping
5C.1 Exploiting Symmetry in SAT-Based Boolean Matching for Heterogeneous FPGA Technology Mapping
5C.2 Combinational and Sequential Mapping with Priority Cuts
5C.3 A general model for performance optimization of sequential systems
5C.4 Timing Constraint-driven Technology Mapping for FPGAs Considering False Paths and Multi-Clock D
+ 5D Designers' Perspective: High Speed I/O
+ 6A Advances in Routing and Clock Design
+ 6B Improving Delay Test Generation and Performance Predictors
+ 6C High Level Synthesis
+ 6D Analog Circuit Optimization
+ 7A Global Routing
+ 7B Test Compression and Test Power
+ 7C Gate-level Physical Synthesis
+ 7D Designers' Perspective: Foundry and Circuit Designer Communication
+ 8A Interconnect Modeling and Optimization
+ 8B Embedded Tutorial: Formal verification at Higher Levels of Abstraction
+ 8C Floorplanning
+ 8D System-level Synthesis and Interconnect Design
+ 9A Advances in Model Order Reduction Techniques For Interconnect Analysis
+ 9B Embedded Tutorial: MOSFET Modeling for 45nm & Beyond
+ 9C Voltage Assignment in Floorplanning
+ 9D Variation-Tolerant Circuits
+ 10A Advanced Models for Static Timing Analysis
+ 10B Variation Aware Timing Verification
+ 10C Reliability-Driven Modeling and Analysis for Deep Submicron Technologies
+ 10D Design Automation and Defect Tolerance Techniques for Emerging Technologies
+ 11A Leakage Power Reduction
+ 11B Power Modeling and Optimization
+ 11C Improving Planarity and Patterning
+ 11D Model Order Reduction for Parameterized and Non-Linear Systems